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6.3.6 6.3.7 7.0 Drive Self Test (DST) ...21 Product warranty ...23 24 24 24 24 25 29 29 29 32 34 34 35 35 35 37 37 37 38 42 42 ...
6.3.6 6.3.7 7.0 Drive Self Test (DST) ...21 Product warranty ...23 24 24 24 24 25 29 29 29 32 34 34 35 35 35 37 37 37 38 42 42 ...
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... cables are recognized in accordance with UL 60950 and CSA 60950 as tested by UL(CSA) and EN60950 as tested by bottom holes must be used, with Seagate standards as noted in the appropriate sections of this manual and the Seagate SAS Interface Manual, part number 100293071. 3.0 Applicable standards and reference ... to the enclosure, shielded cables should be given in the areas of those integrating the drive within their systems to perform those tests required and design their system to ensure that equipment operating in the same system as the drive or external to minimize radiation when...
... cables are recognized in accordance with UL 60950 and CSA 60950 as tested by UL(CSA) and EN60950 as tested by bottom holes must be used, with Seagate standards as noted in the appropriate sections of this manual and the Seagate SAS Interface Manual, part number 100293071. 3.0 Applicable standards and reference ... to the enclosure, shielded cables should be given in the areas of those integrating the drive within their systems to perform those tests required and design their system to ensure that equipment operating in the same system as the drive or external to minimize radiation when...
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...appropriate marking for their compliance with the directives/standards for test platforms. The system configurations include Typical current use microprocessor Keyboard Monitor/display Printer Mouse Although the test system with this Seagate model complies with the directives/standards, we cannot guarantee that... all systems will comply. B The drive was tested in such parts or materials. The selected system ...
...appropriate marking for their compliance with the directives/standards for test platforms. The system configurations include Typical current use microprocessor Keyboard Monitor/display Printer Mouse Although the test system with this Seagate model complies with the directives/standards, we cannot guarantee that... all systems will comply. B The drive was tested in such parts or materials. The selected system ...
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...part (at the homogenous material level) is over the threshold defined by the China RoHS MCV Standard. 3.2 Reference documents Seagate part number: 100293068 Seagate part number: 100293071 SFF-8223 SFF-8460 SFF-8470 SFF-8482 ANSI INCITS.xxx ISO/IEC 14776-xxx ISO/IEC ...JEDEC Standards JESD218 - "X" indicates the hazardous and toxic substance content of 20 years. Seagate part number: 100515636 Pulsar.2 SAS Product Manual, Rev. Solid-State Drive (SSD) Requirements and Endurance Test Method JESD219 - "O" indicates the hazardous and toxic substance content of conflict between this ...
...part (at the homogenous material level) is over the threshold defined by the China RoHS MCV Standard. 3.2 Reference documents Seagate part number: 100293068 Seagate part number: 100293071 SFF-8223 SFF-8460 SFF-8470 SFF-8482 ANSI INCITS.xxx ISO/IEC 14776-xxx ISO/IEC ...JEDEC Standards JESD218 - "X" indicates the hazardous and toxic substance content of 20 years. Seagate part number: 100515636 Pulsar.2 SAS Product Manual, Rev. Solid-State Drive (SSD) Requirements and Endurance Test Method JESD219 - "O" indicates the hazardous and toxic substance content of conflict between this ...
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...) interface. The SAS connectors, cables and electrical interface are random access storage devices designed to the drive Vertical, horizontal, or top down mounting Drive Self Test (DST) Background Media Scan (BMS) Parallel flash access channels Power loss data protection Thin Provisioning with the ANSI SCSI-1 standard. B The Self-Encrypting Drive models...
...) interface. The SAS connectors, cables and electrical interface are random access storage devices designed to the drive Vertical, horizontal, or top down mounting Drive Self Test (DST) Background Media Scan (BMS) Parallel flash access channels Power loss data protection Thin Provisioning with the ANSI SCSI-1 standard. B The Self-Encrypting Drive models...
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...370/190 370/190 48,000/12,000 48,000/12,000 48,000/15,000 48,000/15,000 [3] 23,000 22,000 Testing performed at Queue Depth = 32, Sequentially Preconditioned drive, using IOMeter 2006.7.27. Peak performance is preconditioned as mentioned and host commands are ... to ensure the product meets specified reliability specifications. IOMeter is available at Queue Depth = 32, Non-Preconditioned drive, using IOMeter 2006.7.27. Testing performed at http://www.iometer.org/ or http://sourceforge.net/projects/iometer/. IOMeter is licensed under the Intel Open Source License and the GNU...
...370/190 370/190 48,000/12,000 48,000/12,000 48,000/15,000 48,000/15,000 [3] 23,000 22,000 Testing performed at Queue Depth = 32, Sequentially Preconditioned drive, using IOMeter 2006.7.27. Peak performance is preconditioned as mentioned and host commands are ... to ensure the product meets specified reliability specifications. IOMeter is available at Queue Depth = 32, Non-Preconditioned drive, using IOMeter 2006.7.27. Testing performed at http://www.iometer.org/ or http://sourceforge.net/projects/iometer/. IOMeter is licensed under the Intel Open Source License and the GNU...
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It is not the intent of this specification. Test time should also be caused by bandwidth limitations in the host adapter, operating system, or driver limitations. If the drive receives a NOTIFY (ENABLE SPINUP) primitive ...
It is not the intent of this specification. Test time should also be caused by bandwidth limitations in the host adapter, operating system, or driver limitations. If the drive receives a NOTIFY (ENABLE SPINUP) primitive ...
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...maintenance is required. 6.3.3 Hot plugging the drive When a drive is powered on by all the algorithms that the SSD implements. When the self test completes successfully, the drive initiates a Link Reset starting with OOB. If the link reset attempt fails, or any Pulsar.2 SAS Product Manual,...cycles per year. Data Retention when the drive is capable of being sent to provide a sustainable level of SSD cells are not exceeded. Seagate has implemented a Lifetime Endurance Management technique which helps OEMS and user to read the contents of the drive when stored. 6.2.6 Lifetime Endurance...
...maintenance is required. 6.3.3 Hot plugging the drive When a drive is powered on by all the algorithms that the SSD implements. When the self test completes successfully, the drive initiates a Link Reset starting with OOB. If the link reset attempt fails, or any Pulsar.2 SAS Product Manual,...cycles per year. Data Retention when the drive is capable of being sent to provide a sustainable level of SSD cells are not exceeded. Seagate has implemented a Lifetime Endurance Management technique which helps OEMS and user to read the contents of the drive when stored. 6.2.6 Lifetime Endurance...
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... next scheduled interrupt is interruptible. functions. When enabled, S.M.A.R.T. interruptions occur. Performance impact S.M.A.R.T. time the drive looses sync, the drive initiated link reset. If the self-test fails, the drive does not respond to control when S.M.A.R.T. Note. The drive's firmware monitors specific attributes for Self-Monitoring Analysis and Reporting Technology. feature. An...
... next scheduled interrupt is interruptible. functions. When enabled, S.M.A.R.T. interruptions occur. Performance impact S.M.A.R.T. time the drive looses sync, the drive initiated link reset. If the self-test fails, the drive does not respond to control when S.M.A.R.T. Note. The drive's firmware monitors specific attributes for Self-Monitoring Analysis and Reporting Technology. feature. An...
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... a system level. There are not modified to recognize drive fault conditions that performs various tests on this drive. 6.3.6.2.1 State of the drive. If the drive fails the test, remove it from service and return it to Seagate for the extended test) in bytes 1, bits 5, 6, and 7. For example, a drive may not be in process of...
... a system level. There are not modified to recognize drive fault conditions that performs various tests on this drive. 6.3.6.2.1 State of the drive. If the drive fails the test, remove it from service and return it to Seagate for the extended test) in bytes 1, bits 5, 6, and 7. For example, a drive may not be in process of...
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...are used to report the failure condition. 6.3.6.2.5 Abort There are several ways to make room for the reason reported in the Self-test Results Log page. Applications can abort a DST executing in background mode by a reset condition). 22 Pulsar.2 SAS Product Manual, Rev. B extended ... in the DST command 2. All other abort mechanisms will cause a 01 (self-test aborted by inserting a new self-test parameter block at the beginning of the self-test results log parameter section of the extended test option is checked through the Control Mode page. 6.3.6.2.4 Log page entries When the...
...are used to report the failure condition. 6.3.6.2.5 Abort There are several ways to make room for the reason reported in the Self-test Results Log page. Applications can abort a DST executing in background mode by a reset condition). 22 Pulsar.2 SAS Product Manual, Rev. B extended ... in the DST command 2. All other abort mechanisms will cause a 01 (self-test aborted by inserting a new self-test parameter block at the beginning of the self-test results log parameter section of the extended test option is checked through the Control Mode page. 6.3.6.2.4 Log page entries When the...
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...that the drive reaches operating condition and can process media access commands. • Peak operating mode During peak operating mode, the drive is tested in the tables beginning on to simulate the worst-case power consumption. • Idle mode power Idle mode power is measured with the... power (+5V and +12V) through the standard SAS interface. 7.1.1 Power consumption Power requirements for the drives are based on an average of drives tested, under nominal conditions, using +5V and +12V input voltage at 60°C ambient temperature. • Startup power Startup power is measured from ...
...that the drive reaches operating condition and can process media access commands. • Peak operating mode During peak operating mode, the drive is tested in the tables beginning on to simulate the worst-case power consumption. • Idle mode power Idle mode power is measured with the... power (+5V and +12V) through the standard SAS interface. 7.1.1 Power consumption Power requirements for the drives are based on an average of drives tested, under nominal conditions, using +5V and +12V input voltage at 60°C ambient temperature. • Startup power Startup power is measured from ...
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...; 0.50 0.52 0.83 0.35 0.38 0.94 6.70 7.16 [1] [2] [3] [4] [5] [6] Measured with average reading DC ammeter. Instantaneous +12V current peaks will exceed these values. B N (number of drives tested) = 6, 60 Degrees C ambient. Specified voltage tolerance includes ripple, noise, and transient response. 28 Pulsar.2 SAS Product Manual, Rev. The ±5% must return to accept selection...
...; 0.50 0.52 0.83 0.35 0.38 0.94 6.70 7.16 [1] [2] [3] [4] [5] [6] Measured with average reading DC ammeter. Instantaneous +12V current peaks will exceed these values. B N (number of drives tested) = 6, 60 Degrees C ambient. Specified voltage tolerance includes ripple, noise, and transient response. 28 Pulsar.2 SAS Product Manual, Rev. The ±5% must return to accept selection...
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... axis. For less than once every 2 seconds. B Note. The drive subjected to meet or exceed applicable ISTA and ASTM standards. Packaged Seagate finished drive bulk packs are printed on pallets to intermittent shock not exceeding: • 1000 Gs at a maximum duration of non-operating shock ...shall apply to be shipped from testing at this level. Volume finished drives will be repeated more than full shipments, instructions are designed and tested to nonrepetitive shock not exceeding the three values below, shall not exhibit device...
... axis. For less than once every 2 seconds. B Note. The drive subjected to meet or exceed applicable ISTA and ASTM standards. Packaged Seagate finished drive bulk packs are printed on pallets to intermittent shock not exceeding: • 1000 Gs at a maximum duration of non-operating shock ...shall apply to be shipped from testing at this level. Volume finished drives will be repeated more than full shipments, instructions are designed and tested to nonrepetitive shock not exceeding the three values below, shall not exhibit device...
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...ASTM B845. Sulfur is designed to operate in a typical office environment with minimal environmental control. 7.5.6 Corrosive environment Seagate electronic drive components pass accelerated corrosion testing equivalent to 10 years exposure to condensing water on the surface of handling and transportation. Operating-abnormal Equipment as...Hz 7.5.5 Air cleanliness 11.08 GRMS 11.08 GRMS This specification does not cover connection issues that may result from testing at this level. 11.08 GRMS This specification does not cover connection issues that can be applied in cabinet fabrication...
...ASTM B845. Sulfur is designed to operate in a typical office environment with minimal environmental control. 7.5.6 Corrosive environment Seagate electronic drive components pass accelerated corrosion testing equivalent to 10 years exposure to condensing water on the surface of handling and transportation. Operating-abnormal Equipment as...Hz 7.5.5 Air cleanliness 11.08 GRMS 11.08 GRMS This specification does not cover connection issues that may result from testing at this level. 11.08 GRMS This specification does not cover connection issues that can be applied in cabinet fabrication...
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...of Standards and Technology (NIST). National Voluntary Laboratory Accreditation Program (NVLAP) accredited laboratories perform cryptographic module compliance/conformance testing. Security Level 2 Security Level 2 enhances the physical security mechanisms of a Security Level 1 cryptographic module by ...-2)' and is a U.S. These levels are placed on the NIST website. Seagate Enterprise SED The SEDs referenced in which includes the use independent, accredited testing laborites to accredit cryptographic modules. 8.0 About FIPS The Federal Information Processing Standard...
...of Standards and Technology (NIST). National Voluntary Laboratory Accreditation Program (NVLAP) accredited laboratories perform cryptographic module compliance/conformance testing. Security Level 2 Security Level 2 enhances the physical security mechanisms of a Security Level 1 cryptographic module by ...-2)' and is a U.S. These levels are placed on the NIST website. Seagate Enterprise SED The SEDs referenced in which includes the use independent, accredited testing laborites to accredit cryptographic modules. 8.0 About FIPS The Federal Information Processing Standard...
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... storage capacities are not dependent on host (initiator) defect management routines. 10.1 Drive internal defects/errors During the initial drive manufacturing test operation at the factory, media defects are listed in the "G" list (defects growth list). At factory format time, these known ...command pending T10 standardization of the 110b format is , marked as the "P' list). Also, more than one flash controller. In addition, Seagate provides the following table. The CHANNEL field contains the channel number within the corresponding Flash Controller. B 45 The definition of a format ...
... storage capacities are not dependent on host (initiator) defect management routines. 10.1 Drive internal defects/errors During the initial drive manufacturing test operation at the factory, media defects are listed in the "G" list (defects growth list). At factory format time, these known ...command pending T10 standardization of the 110b format is , marked as the "P' list). Also, more than one flash controller. In addition, Seagate provides the following table. The CHANNEL field contains the channel number within the corresponding Flash Controller. B 45 The definition of a format ...
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... Error page (06h) Pages Supported list (00h) Protocol-Specific Port log pages (18h) Read Error Counter page (03h) Read Reverse Error Counter page (04h) Self-test Results page (10h) Solid State Media log page (11h) Start-stop Cycle Counter page (0Eh) Temperature page (0Dh) Vendor Unique page (3Ch) Verify Error Counter...
... Error page (06h) Pages Supported list (00h) Protocol-Specific Port log pages (18h) Read Error Counter page (03h) Read Reverse Error Counter page (04h) Self-test Results page (10h) Solid State Media log page (11h) Start-stop Cycle Counter page (0Eh) Temperature page (0Dh) Vendor Unique page (3Ch) Verify Error Counter...
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... IN SECURITY PROTOCOL OUT SEEK (6) SEEK (10) SEND DIAGNOSTICS Supported Diagnostics pages (00h) Translate page (40h) START UNIT/STOP UNIT SYNCHRONIZE CACHE SYNCHRONIZE CACHE (16) TEST UNIT READY UNMAP 7Fh/0009h 3Ch 25h 9Eh/10h 37h B7h 3Eh 9Eh/11h 07h 1Ch 17h 57h A0h 03h 16h 56h 01h 48h ---/03h...
... IN SECURITY PROTOCOL OUT SEEK (6) SEEK (10) SEND DIAGNOSTICS Supported Diagnostics pages (00h) Translate page (40h) START UNIT/STOP UNIT SYNCHRONIZE CACHE SYNCHRONIZE CACHE (16) TEST UNIT READY UNMAP 7Fh/0009h 3Ch 25h 9Eh/10h 37h B7h 3Eh 9Eh/11h 07h 1Ch 17h 57h A0h 03h 16h 56h 01h 48h ---/03h...
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... about the SCSI commands used by the relevant ANSI standard. 12.7 Additional information Please contact your Seagate representative for SAS electrical details, if required. Table 26: State LED off, high LED on, low LED drive signal Test condition 0 V ≤ VOH ≤ 3.6 V IOL = 15 mA Output voltage -100 ... with the intra-enclosure (internal connector) requirements of channels bounded by the best and worst case channels as defined by Seagate SAS drives, refer to the proper +3.3 volt supply through an appropriate current limiting resistor. Table 27 defines the general interface...
... about the SCSI commands used by the relevant ANSI standard. 12.7 Additional information Please contact your Seagate representative for SAS electrical details, if required. Table 26: State LED off, high LED on, low LED drive signal Test condition 0 V ≤ VOH ≤ 3.6 V IOL = 15 mA Output voltage -100 ... with the intra-enclosure (internal connector) requirements of channels bounded by the best and worst case channels as defined by Seagate SAS drives, refer to the proper +3.3 volt supply through an appropriate current limiting resistor. Table 27 defines the general interface...