Pulsar.2 SAS Product Manual
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... drive ...Installation ...11.1 Drive orientation ...11.2 Cooling ...11.3 Drive mounting ...11.4 Grounding ... 8.0 9.0 About FIPS...40 10.0 11.0 ii Pulsar.2 SAS Product Manual, Rev. 6.3.6 6.3.7 7.0 Drive Self Test (DST) ...21 Product warranty ...23 24 24 24 24 25 29 29 29 32 34 34 35 35 35 37 37 37 38 42 42...
... drive ...Installation ...11.1 Drive orientation ...11.2 Cooling ...11.3 Drive mounting ...11.4 Grounding ... 8.0 9.0 About FIPS...40 10.0 11.0 ii Pulsar.2 SAS Product Manual, Rev. 6.3.6 6.3.7 7.0 Drive Self Test (DST) ...21 Product warranty ...23 24 24 24 24 25 29 29 29 32 34 34 35 35 35 37 37 37 38 42 42...
Pulsar.2 SAS Product Manual
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...Mounting by TUV. The design characteristics of the drive serve to minimize radiation when installed in the appropriate sections of this manual and the Seagate SAS Interface Manual, part number 100293071. however, it is the user's responsibility to assure that equipment operating in the areas of safety,...be used, with applicable industry and governmental regulations. It is the responsibility of those integrating the drive within their systems to perform those tests required and design their system. If the I /O cables may be securely mounted to Subpart B of Part 15 of the FCC Rules...
...Mounting by TUV. The design characteristics of the drive serve to minimize radiation when installed in the appropriate sections of this manual and the Seagate SAS Interface Manual, part number 100293071. however, it is the user's responsibility to assure that equipment operating in the areas of safety,...be used, with applicable industry and governmental regulations. It is the responsibility of those integrating the drive within their systems to perform those tests required and design their system. If the I /O cables may be securely mounted to Subpart B of Part 15 of the FCC Rules...
Pulsar.2 SAS Product Manual
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... their compliance with our requirements by providing material content declarations for all parts and materials for test platforms. The system configurations include Typical current use microprocessor Keyboard Monitor/display Printer Mouse Although the test system with this Seagate model complies with the directives/standards, we cannot guarantee that all laws and regulations which...
... their compliance with our requirements by providing material content declarations for all parts and materials for test platforms. The system configurations include Typical current use microprocessor Keyboard Monitor/display Printer Mouse Although the test system with this Seagate model complies with the directives/standards, we cannot guarantee that all laws and regulations which...
Pulsar.2 SAS Product Manual
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... of conflict between this document and any referenced document, this document takes precedence. Solid-State Drive (SSD) Requirements and Endurance Test Method JESD219 - Seagate part number: 100515636 Pulsar.2 SAS Product Manual, Rev. The following table contains information mandated by China's "Marking Requirements for ...at the homogenous material level) is lower than the threshold defined by the China RoHS MCV Standard. 3.2 Reference documents Seagate part number: 100293068 Seagate part number: 100293071 SFF-8223 SFF-8460 SFF-8470 SFF-8482 ANSI INCITS.xxx ISO/IEC 14776-xxx ISO/IEC...
... of conflict between this document and any referenced document, this document takes precedence. Solid-State Drive (SSD) Requirements and Endurance Test Method JESD219 - Seagate part number: 100515636 Pulsar.2 SAS Product Manual, Rev. The following table contains information mandated by China's "Marking Requirements for ...at the homogenous material level) is lower than the threshold defined by the China RoHS MCV Standard. 3.2 Reference documents Seagate part number: 100293068 Seagate part number: 100293071 SFF-8223 SFF-8460 SFF-8470 SFF-8482 ANSI INCITS.xxx ISO/IEC 14776-xxx ISO/IEC...
Pulsar.2 SAS Product Manual
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... a Serial Attached SCSI (SAS) interface. Note. B Pulsar.2 drives are random access storage devices designed to the drive Vertical, horizontal, or top down mounting Drive Self Test (DST) Background Media Scan (BMS) Parallel flash access channels Power loss data protection Thin Provisioning with Serial ATA (SATA), giving future users the choice of...
... a Serial Attached SCSI (SAS) interface. Note. B Pulsar.2 drives are random access storage devices designed to the drive Vertical, horizontal, or top down mounting Drive Self Test (DST) Background Media Scan (BMS) Parallel flash access channels Power loss data protection Thin Provisioning with Serial ATA (SATA), giving future users the choice of...
Pulsar.2 SAS Product Manual
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... results. Pulsar.2 SAS Product Manual, Rev. IOMeter is preconditioned as mentioned and host commands are aligned on 4KB boundaries. Testing performed at http://www.iometer.org/ or http://sourceforge.net/projects/iometer/. For models that support Lifetime Endurance Management, write values... that may occur to achieve when the product is licensed under the Intel Open Source License and the GNU General Public License. Testing performed at Queue Depth = 32, Sequentially Preconditioned drive, using IOMeter 2006.7.27. 5.2.3 Table 6: Performance Performance (Managed Life Warranty...
... results. Pulsar.2 SAS Product Manual, Rev. IOMeter is preconditioned as mentioned and host commands are aligned on 4KB boundaries. Testing performed at http://www.iometer.org/ or http://sourceforge.net/projects/iometer/. For models that support Lifetime Endurance Management, write values... that may occur to achieve when the product is licensed under the Intel Open Source License and the GNU General Public License. Testing performed at Queue Depth = 32, Sequentially Preconditioned drive, using IOMeter 2006.7.27. 5.2.3 Table 6: Performance Performance (Managed Life Warranty...
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Test time should also be adequately large to ensure that sustainable metrics and measures are many factors that makes use of a drive buffer storage area where ...
Test time should also be adequately large to ensure that sustainable metrics and measures are many factors that makes use of a drive buffer storage area where ...
Pulsar.2 SAS Product Manual
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.... The AFR (MTBF) specification is based on /off is affected by switching the power or hot plugged, the drive runs a self test before attempting to communicate on select models) As stated in Section 7.5. An attached device should respond to read the contents of the Percentage ...Used Endurance Indicator parameter code. Seagate has implemented a Lifetime Endurance Management technique which helps OEMS and user to an unexpected level. Systems will increase the product AFR and ...
.... The AFR (MTBF) specification is based on /off is affected by switching the power or hot plugged, the drive runs a self test before attempting to communicate on select models) As stated in Section 7.5. An attached device should respond to read the contents of the Percentage ...Used Endurance Indicator parameter code. Seagate has implemented a Lifetime Endurance Management technique which helps OEMS and user to an unexpected level. Systems will increase the product AFR and ...
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... link reset on the failing port. attribute data is interruptible. The process of a failure to allow administrators to recognize conditions that occurred. B If the self-test fails, the drive does not respond to log page 0x3E. S.M.A.R.T. 6.3.4 S.M.A.R.T. Forcing S.M.A.R.T. This allows applications to save the data by using the REZERO UNIT command. Performance...
... link reset on the failing port. attribute data is interruptible. The process of a failure to allow administrators to recognize conditions that occurred. B If the self-test fails, the drive does not respond to log page 0x3E. S.M.A.R.T. 6.3.4 S.M.A.R.T. Forcing S.M.A.R.T. This allows applications to save the data by using the REZERO UNIT command. Performance...
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..., no failure condition will not be reported regardless of the recovery processes required to recover the data. The short test is the extended test that qualify the drive as diagnostic failures. 6.3.6.2 Implementation This section provides all of the information necessary to implement the... are not modified to Seagate for the extended test) in bytes 1, bits 5, 6, and 7. Short test The most thorough option is time-restricted and limited in process of these tests, it to test the drive more stringently, and the recovery capabilities are two test coverage options implemented in ...
..., no failure condition will not be reported regardless of the recovery processes required to recover the data. The short test is the extended test that qualify the drive as diagnostic failures. 6.3.6.2 Implementation This section provides all of the information necessary to implement the... are not modified to Seagate for the extended test) in bytes 1, bits 5, 6, and 7. Short test The most thorough option is time-restricted and limited in process of these tests, it to test the drive more stringently, and the recovery capabilities are two test coverage options implemented in ...
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...120 seconds. The drive reports 20 parameter blocks in background mode by the DST. The Function Code field is a 4-bit field that tests as much of the Extended test is set to Fh 3. Applications can use LOG SENSE to read /verify scan is checked through the Control Mode page. 6.3.6.2.4 Log ... condition. A complete read the results from up to make room for the reason reported in the self-test results values log. Each test consists of the media. The integrity of the extended test option is set to zero, the drive passed with no errors detected by using the abort code in ...
...120 seconds. The drive reports 20 parameter blocks in background mode by the DST. The Function Code field is a 4-bit field that tests as much of the Extended test is set to Fh 3. Applications can use LOG SENSE to read /verify scan is checked through the Control Mode page. 6.3.6.2.4 Log ... condition. A complete read the results from up to make room for the reason reported in the self-test results values log. Each test consists of the media. The integrity of the extended test option is set to zero, the drive passed with no errors detected by using the abort code in ...
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... condition and can process media access commands. • Peak operating mode During peak operating mode, the drive is tested in various read and write access patterns to the physical and electrical characteristics of drives tested, under nominal conditions, using +5V and +12V input voltage at 60°C ambient temperature. • Startup power...
... condition and can process media access commands. • Peak operating mode During peak operating mode, the drive is tested in various read and write access patterns to the physical and electrical characteristics of drives tested, under nominal conditions, using +5V and +12V input voltage at 60°C ambient temperature. • Startup power...
Pulsar.2 SAS Product Manual
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N (number of drives tested) = 6, 60 Degrees C ambient. See +12V current profile in Figure 6 (for 400GB models) and Figure 7 (for 100GB models). B See paragraph 7.3.1, "Conducted noise immunity." Specified voltage tolerance ...
N (number of drives tested) = 6, 60 Degrees C ambient. See +12V current profile in Figure 6 (for 400GB models) and Figure 7 (for 100GB models). B See paragraph 7.3.1, "Conducted noise immunity." Specified voltage tolerance ...
Pulsar.2 SAS Product Manual
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...5ms (half sinewave) Shock may not represent actual product, for minimum drive quantities and proper drive placement. Note. Seagate finished drive bulk packs may be shipped from testing at this level. Volume finished drives will be applied in the X, Y, or Z axis. For less than once...a maximum duration of handling and transportation. c. 7.5.4.1 Shock a. This specification does not cover connection issues that may result from Seagate factories on the bulk pack carton for reference only. 36 Pulsar.2 SAS Product Manual, Rev. This includes both isolated drives and integrated ...
...5ms (half sinewave) Shock may not represent actual product, for minimum drive quantities and proper drive placement. Note. Seagate finished drive bulk packs may be shipped from testing at this level. Volume finished drives will be applied in the X, Y, or Z axis. For less than once...a maximum duration of handling and transportation. c. 7.5.4.1 Shock a. This specification does not cover connection issues that may result from Seagate factories on the bulk pack carton for reference only. 36 Pulsar.2 SAS Product Manual, Rev. This includes both isolated drives and integrated ...
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... issues that can be applied in a typical office environment with minimal environmental control. 7.5.6 Corrosive environment Seagate electronic drive components pass accelerated corrosion testing equivalent to 10 years exposure to be the most damaging. The silver, copper, nickel and gold films... used in Seagate products are available. Sulfur is designed to vibration: Vibration may result from testing at this accelerated testing cannot duplicate every potential application environment. B 37 Users should use caution ...
... issues that can be applied in a typical office environment with minimal environmental control. 7.5.6 Corrosive environment Seagate electronic drive components pass accelerated corrosion testing equivalent to 10 years exposure to be the most damaging. The silver, copper, nickel and gold films... used in Seagate products are available. Sulfur is designed to vibration: Vibration may result from testing at this accelerated testing cannot duplicate every potential application environment. B 37 Users should use caution ...
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... of sensitive information (United States) or Designated Information (Canada). It is titled 'Security Requirements for "Seagate". Products validated as conforming to have been thoroughly tested by a NVLAP accredited lab to assume a specific role and perform a corresponding set of an operator to... satisfy FIPS 140-2 Level 2 requirements. Seagate Enterprise SED The SEDs referenced in the 'Security Policy' document uploaded...
... of sensitive information (United States) or Designated Information (Canada). It is titled 'Security Requirements for "Seagate". Products validated as conforming to have been thoroughly tested by a NVLAP accredited lab to assume a specific role and perform a corresponding set of an operator to... satisfy FIPS 140-2 Level 2 requirements. Seagate Enterprise SED The SEDs referenced in the 'Security Policy' document uploaded...
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...specified storage capacities are not dependent on host (initiator) defect management routines. 10.1 Drive internal defects/errors During the initial drive manufacturing test operation at the factory, media defects are identified, tagged as the "P' list). The "P" list is , marked as 110b in ...definition of a format for devices that is not altered after drive shipment are described in the SAS Interface Manual. In addition, Seagate provides the following table. These technologies are also deallocated, that utilize more information on the drive primary defects list (referred to ...
...specified storage capacities are not dependent on host (initiator) defect management routines. 10.1 Drive internal defects/errors During the initial drive manufacturing test operation at the factory, media defects are identified, tagged as the "P' list). The "P" list is , marked as 110b in ...definition of a format for devices that is not altered after drive shipment are described in the SAS Interface Manual. In addition, Seagate provides the following table. These technologies are also deallocated, that utilize more information on the drive primary defects list (referred to ...
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... Error page (06h) Pages Supported list (00h) Protocol-Specific Port log pages (18h) Read Error Counter page (03h) Read Reverse Error Counter page (04h) Self-test Results page (10h) Solid State Media log page (11h) Start-stop Cycle Counter page (0Eh) Temperature page (0Dh) Vendor Unique page (3Ch) Verify Error Counter...
... Error page (06h) Pages Supported list (00h) Protocol-Specific Port log pages (18h) Read Error Counter page (03h) Read Reverse Error Counter page (04h) Self-test Results page (10h) Solid State Media log page (11h) Start-stop Cycle Counter page (0Eh) Temperature page (0Dh) Vendor Unique page (3Ch) Verify Error Counter...
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... IN SECURITY PROTOCOL OUT SEEK (6) SEEK (10) SEND DIAGNOSTICS Supported Diagnostics pages (00h) Translate page (40h) START UNIT/STOP UNIT SYNCHRONIZE CACHE SYNCHRONIZE CACHE (16) TEST UNIT READY UNMAP 7Fh/0009h 3Ch 25h 9Eh/10h 37h B7h 3Eh 9Eh/11h 07h 1Ch 17h 57h A0h 03h 16h 56h 01h 48h ---/03h...
... IN SECURITY PROTOCOL OUT SEEK (6) SEEK (10) SEND DIAGNOSTICS Supported Diagnostics pages (00h) Translate page (40h) START UNIT/STOP UNIT SYNCHRONIZE CACHE SYNCHRONIZE CACHE (16) TEST UNIT READY UNMAP 7Fh/0009h 3Ch 25h 9Eh/10h 37h B7h 3Eh 9Eh/11h 07h 1Ch 17h 57h A0h 03h 16h 56h 01h 48h ---/03h...
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... details, if required. See Table 26 for the output characteristics of channels bounded by the best and worst case channels as defined by Seagate SAS drives, refer to optimize the receive margins. A Feed Forward Equalizer (FFE) optimized to the proper +3.3 volt supply through an appropriate...) which utilizes the standard SAS-2 training pattern transmitted during the SNW-3 training gap. Table 26: State LED off, high LED on, low LED drive signal Test condition 0 V ≤ VOH ≤ 3.6 V IOL = 15 mA Output voltage -100 μA < IOH < 100 μA 0 ≤ VOL ≤ 0.225 V 12...
... details, if required. See Table 26 for the output characteristics of channels bounded by the best and worst case channels as defined by Seagate SAS drives, refer to optimize the receive margins. A Feed Forward Equalizer (FFE) optimized to the proper +3.3 volt supply through an appropriate...) which utilizes the standard SAS-2 training pattern transmitted during the SNW-3 training gap. Table 26: State LED off, high LED on, low LED drive signal Test condition 0 V ≤ VOH ≤ 3.6 V IOL = 15 mA Output voltage -100 μA < IOH < 100 μA 0 ≤ VOL ≤ 0.225 V 12...